Yushu Li

Names

Contact

Affiliations

• Norges Handelshøyskole (NHH) → Institutt for foretaksøkonomi
  • website
  • location: Bergen, Norway

Research profile

author of:

• Testing for Unit Roots in Panel Data Using a Wavelet Ratio Method
  by Yushu Li & Ghazi Shukur
• Linear and Non-linear Causality Test in a LSTAR model - wavelet decomposition in a non-linear environment
  by Li, Yushu & Shukur, Ghazi
• Wavelet Based Outlier Correction for Power Controlled Turning Point Detection in Surveillance Systems
  by Li, Yushu
• Wavelet Improvement in Turning Point Detection using a Hidden Markov Model
  by Li, Yushu & Reese, Simon
• Testing for Structural Breaks in the Presence of Data Perturbations: Impacts and Wavelet Based Improvements
  by Reese, Simon & Li, Yushu
• Wavelet Based Outlier Correction for Power Controlled Turning Point Detection in Surveillance Systems
  by Yushu Li
• Wavelet based outlier correction for power controlled turning point detection in surveillance systems
  by Li, Yushu
• Wavelet Improvement of the Over-rejection of Unit root test under GARCH errors
  by Li, Yushu & Shukur, Ghazi
• Testing for Unit Root against LSTAR model – wavelet improvements under GARCH distortion
  by Li, Yushu & Shukur, Ghazi
• Wavelet improvement in turning point detection using a Hidden Markov Model
  by Li, Yushu & Reese, Simon
• How Flexible are the Inflation Targets? A Bayesian MCMC Estimator of the Long Memory Parameter in a State Space Model
  by Andersson, Fredrik N. G. & Li, Yushu
• Estimating Long Memory Causality Relationships by a Wavelet Method
  by Li, Yushu
• Testing for Unit Root against LSTAR Model: Wavelet Improvement under GARCH Distortion
  by Li, Yushu & Shukur, Ghazi
• Estimating and Forecasting APARCH-Skew-t Models by Wavelet Support Vector Machines
  by Li, Yushu
• A simple wavelet-based test for serial correlation in panel data models
  by Li, Yushu & Andersson, Fredrik N. G.
• A Likelihood Ratio and Markov Chain Based Method to Evaluate Density Forecasting
  by Li, Yushu & Andersson, Jonas
• A Simple Wavelet-Based Test for Serial Correlation in Panel Data Models
  by Li, Yushu & Andersson, Fredrik N. G.
• A Simulation of Economic Effects of Technology Transfer in Cereal Production
  by Y. Li & L. P. Apedaile