Philippe VANDEN EECKAUT
Names
first: |
Philippe |
last: |
VANDEN EECKAUT |
Identifer
Contact
Affiliations
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Université de Lille
/ Faculté des sciences économiques, sociales et des territoires
/ Institut des Sciences Économiques et du Management
Research profile
author of:
- The European university landscape: A micro characterization based on evidence from the Aquameth project (RePEc:aiz:louvar:2011041)
by Daraio, Cinzia & Bonaccorsi, Andrea & Geuna, Aldo & Lepori, Benedetto & Bach, Laurent & Simar, Leopold & Vanden Eeckaut, Philippe - Non-frontier measures of efficiency, progress and regress (RePEc:cor:louvco:1991055)
by Tulkens, H. & Vanden Eeckaut, Ph. - A Study of Cost-Efficiency and Returns to Scale for 235 Municipalities in Belgium (RePEc:cor:louvco:1991058)
by Vanden Eeckaut, Ph. & Tulkens, H. & Jamar, M-A. - Non-Parametric Efficiency, Progress and Regress Measures for Panel Data : Methodological Aspects (RePEc:cor:louvco:1993016)
by TULKENS, Henry & VANDEN EECKAUT, Philippe - Radial and Nonradial Technical Efficiency Measures on a DEA Reference Technology : A Comparison using US Banking Data (RePEc:cor:louvco:1994023)
by FERRIER, Gary & KERSTENS, Kris & VANDEN EECKAUT, Philippe - Noise vs Inefficiency. Evidence from Mass Transit (RePEc:cor:louvco:1994051)
by VANDEN EECKAUT, Philippe & WUNSCH, Pierre - Technical Efficiency Measures on DEA and FDH : A Reconsideration of the Axiomatic Literature (RePEc:cor:louvco:1995013)
by KERSTENs, Kris & VANDEN EECKAUT, Philippe - Fuzzy Pairwise Dominance and Implications for Technical Efficiency Performance Assessment (RePEc:cor:louvco:1996036)
by TRIANTIS, Konstantinos & VANDEN EECKAUT, Philippe - Estimating returns to scale using nonparametric deterministic technologies : a new method based on goodness-of-fit (RePEc:cor:louvco:1997013)
by KERSTENS, Kristiaan & VANDEN EECKAUT, Philippe - Distinguishing technical and scale efficiency on non-convex and convex technologies: theoretical analysis and empirical illustrations (RePEc:cor:louvco:1998055)
by KERSTENS , Kristiaan & VANDEN EECKAUT, Philippe - Museum assessment and FDH technology: a global approach (RePEc:cor:louvco:1999038)
by MAIRESSE, François & VANDEN EECKAUT, Philippe - Cost efficiency in Belgian municipalities (RePEc:cor:louvrp:1033)
by VANDEN EECKAUT, Philippe & TULKENS, Henry & JAMAR, Marie-Astrid - Evoluating the performance of the US credit unions (RePEc:cor:louvrp:1040)
by FRIED, Harold O. & LOVELL, C.A. Knox & VANDEN EECKAUT, Philippe - Non-parametric efficiency, progress and regress measures for panel data: Methodological aspects (RePEc:cor:louvrp:1132)
by Tulkens, H. & Vanden Eeckaut, P. - Radial and nonradial technical efficiency measures on a DEA reference technology: a comparison using US banking data (RePEc:cor:louvrp:1156)
by Ferrier, G. D. & Kerstens, K. & Vanden Eeckaut, P. - Non-frontier measures of efficiency, progress and regress for time series data (RePEc:cor:louvrp:1159)
by Tulkens, H. & Vanden Eeckaut, P. - Service productivity in U.S. credit unions (RePEc:cor:louvrp:1169)
by Fried, H. O. & Knox Lovell, C.A. & Vanden Eeckaut, P. - Radial and nonradial static efficiency decompositions: a focus on congestion measurement (RePEc:cor:louvrp:1323)
by DERVAUX, Benoît & KERSTENS, Kristiaan & VANDEN EECKAUT, Philippe - Mesurer l'efficacité: avec ou sans frontières? (RePEc:cor:louvrp:1405)
by TULKENS, Henry & VANDEN EECKAUT, Philippe - Museum assessment and FDH technology: towards a global approach (RePEc:cor:louvrp:1565)
by MAIRESSE, François & VANDEN EECKAUT, Philippe - Radial and Nonradial Technical Efficiency Measures on DEA Reference Technology : A Comparison Using US Banking Data (RePEc:ctl:louvre:1994043)
by Gary D. FERRIER & Kristiaan KERSTENS & Philippe VANDEN EECKAUT - Estimating returns to scale using non-parametric deterministic technologies: A new method based on goodness-of-fit (RePEc:eee:ejores:v:113:y:1999:i:1:p:206-214)
by Kerstens, Kristiaan & Vanden Eeckaut, Philippe - Non-parametric efficiency, progress and regress measures for panel data: Methodological aspects (RePEc:eee:ejores:v:80:y:1995:i:3:p:474-499)
by Tulkens, Henry & Vanden Eeckaut, Philippe - Evaluating the performance of US credit unions (RePEc:eee:jbfina:v:17:y:1993:i:2-3:p:251-265)
by Fried, Harold O. & Knox Lovell, C. A. & Eeckaut, Philippe Vanden - Non-frontier measures of efficiency, progress and regress for time series data (RePEc:eee:proeco:v:39:y:1995:i:1-2:p:83-97)
by Tulkens, Henry & Vanden Eeckaut, Philippe - The European university landscape: A micro characterization based on evidence from the Aquameth project (RePEc:eee:respol:v:40:y:2011:i:1:p:148-164)
by Daraio, Cinzia & Bonaccorsi, Andrea & Geuna, Aldo & Lepori, Benedetto & Bach, Laurent & Bogetoft, Peter & F. Cardoso, Margarida & Castro-Martinez, Elena & Crespi, Gustavo & de Lucio, Ignacio Fernandez - Radial and nonradial static efficiency decompositions: a focus on congestion measurement (RePEc:eee:transb:v:32:y:1998:i:5:p:299-312)
by Dervaux, Benoît & Kerstens, Kristiaan & Vanden Eeckaut, Philippe - The University Benchmarker: An Interactive Computer Approach (RePEc:elg:eechap:12626_14)
by Peter Bogetoft & Harold O. Fried & Philippe Vanden Eeckaut - The European university landscape : A micro characterization based on evidence from the Aquameth project (RePEc:hal:gemptp:hal-01804931)
by Cinzia Daraio & Andrea Bonaccorsi & Aldo Geuna & Benedetto Lepori & Laurent Bach & Peter Bogetoft & Margarida Fonseca Cardoso & Elena Castro-Martinez & Gustavo Crespi & Ignacio Fernández de Lucio & Ha - Non-convex Technologies and Cost Functions: Definitions, Duality and Nonparametric Tests of Convexity (RePEc:hal:journl:hal-00211174)
by W. Briec & K. Kerstens & P. Vanden Eeckaut - The European university landscape : A micro characterization based on evidence from the Aquameth project (RePEc:hal:journl:hal-01804931)
by Cinzia Daraio & Andrea Bonaccorsi & Aldo Geuna & Benedetto Lepori & Laurent Bach & Peter Bogetoft & Margarida Fonseca Cardoso & Elena Castro-Martinez & Gustavo Crespi & Ignacio Fernández de Lucio & Ha - Non-parametric efficiency, progress and regress measures for panel data: Methodological aspects (RePEc:hal:journl:hal-03526985)
by Henry Tulkens & Philippe Vanden Eeckaut - Estimating returns to scale using non-parametric deterministic technologies: A new method based on goodness-of-fit (RePEc:hal:journl:hal-03526993)
by Kristiaan Kerstens & Philippe Vanden Eeckaut - Museum Assessment and FDH Technology: Towards a Global Approach (RePEc:kap:jculte:v:26:y:2002:i:4:p:261-286)
by François Mairesse & Philippe Vanden Eeckaut - Non-convex Technologies and Cost Functions: Definitions, Duality and Nonparametric Tests of Convexity (Journal of Economics 81(2):155–192) (RePEc:kap:jeczfn:v:87:y:2006:i:3:p:307-308)
by Walter Briec & Kristiaan Kerstens & Philippe Vanden Eeckaut - Museum assessment and FDH technology: Towards a global approach (RePEc:ulb:ulbeco:2013/166509)
by François Mairesse & Philippe Vanden Eeckaut - A new criterion for technical efficiency measures: non-monotonicity across dimensions axioms (RePEc:wly:mgtdec:v:20:y:1999:i:1:p:45-59)
by Kristiaan Kerstens & Philippe Vanden Eeckaut