Ron S. Kenett

Names

Identifer

Contact

Affiliations

• Università degli Studi di Torino / Dipartimento di Scienze Economico-Sociali e Matematico-Statistiche (weight: 14%)
  • EDIRC entry
  • location:
• Univerza v Ljubljani / Ekonomska fakuteta (weight: 1%)
  • EDIRC entry
  • location:
• Samuel Neaman Institute, Technion (weight: 60%)
  • http://www.neaman.org.il/EN/Ron-Kenett
  • location: Israel, Haifa

Research profile

author of:

• Adversarial AI in Insurance: Pervasiveness and Resilience (RePEc:arx:papers:2301.07520)
  by Elisa Luciano & Matteo Cattaneo & Ron Kenett
• Relative Linkage Disequilibrium: A New measure for association rules (RePEc:bep:unimip:unimi-1069)
  by Silvia Salini & Ron Kenett
• Integrating Operational and Financial Risk Assessments (RePEc:bep:unimip:unimi-1099)
  by Silvia Figini & Ron Kenett & SILVIA SALINI
• On information quality (RePEc:bla:jorssa:v:177:y:2014:i:1:p:3-38)
  by Ron S. Kenett & Galit Shmueli
• Aspects of statistical consulting not taught by academia (RePEc:bla:stanee:v:60:y:2006:i:3:p:396-411)
  by R. Kenett & P. Thyregod
• Modeling and Forecasting Energy Consumption in the Manufacturing Industry in South Asia (RePEc:eco:journ2:2013-01-9)
  by Muslima Zahan & Ron S. Kenett
• The impact of defects on a process with rework (RePEc:eee:ejores:v:80:y:1995:i:2:p:308-327)
  by Agnihothri, Saligrama R. & Kenett, Ron S.
• Integrated Analysis of Behavioural and Health COVID-19 Data Combining Bayesian Networks and Structural Equation Models (RePEc:gam:jijerp:v:19:y:2022:i:8:p:4859-:d:795539)
  by Ron S. Kenett & Giancarlo Manzi & Carmit Rapaport & Silvia Salini
• Adversarial Artificial Intelligence in Insurance: From an Example to Some Potential Remedies (RePEc:gam:jrisks:v:11:y:2023:i:1:p:20-:d:1032785)
  by Behnaz Amerirad & Matteo Cattaneo & Ron S. Kenett & Elisa Luciano
• Bayesian networks of customer satisfaction survey data (RePEc:mil:wpdepa:2007-033)
  by Silvia SALINI & Ron S. KENETT
• Bayesian networks of customer satisfaction survey data (RePEc:mil:wpdepa:2007-33)
  by Silvia SALINI & Ron S. KENETT
• Integrating operational and financial risk assessments (RePEc:mil:wpdepa:2010-002)
  by Silvia FIGINI & Ron S. KENETT & Silvia SALINI
• Integrating operational and financial risk assessments (RePEc:mil:wpdepa:2010-02)
  by Silvia FIGINI & Ron S. KENETT & Silvia SALINI
• Challenges of modeling and analysis in cybermanufacturing: a review from a machine learning and computation perspective (RePEc:spr:joinma:v:34:y:2023:i:2:d:10.1007_s10845-021-01817-9)
  by SungKu Kang & Ran Jin & Xinwei Deng & Ron S. Kenett
• Generalizing research findings for enhanced reproducibility: an approach based on verbal alternative representations (RePEc:spr:scient:v:126:y:2021:i:5:d:10.1007_s11192-021-03914-1)
  by Ron S. Kenett & Abraham Rubinstein
• A review of: The class of CUB models: statistical foundations, inferential issues and empirical evidence by Domenico Piccolo and Rosaria Simone (RePEc:spr:stmapp:v:28:y:2019:i:3:d:10.1007_s10260-019-00475-9)
  by Ron Kenett
• On the planning and design of sample surveys (RePEc:taf:japsta:v:33:y:2006:i:4:p:405-415)
  by Ron Kenett
• Bayesian networks of customer satisfaction survey data (RePEc:taf:japsta:v:36:y:2009:i:11:p:1177-1189)
  by Silvia Salini & Ron Kenett
• On the planning and design of sample surveys (RePEc:taf:japsta:v:38:y:2011:i:11:p:2681-2681)
  by Ron S. Kenett
• From Quality to Information Quality in Official Statistics (RePEc:vrs:offsta:v:32:y:2016:i:4:p:867-885:n:7)
  by Kenett Ron S. & Shmueli Galit
• ‘Post‐financial meltdown: What do the services industries need from us now?’ by Roger W. Hoerl and Ronald D. Snee: Discussion 2 (RePEc:wly:apsmbi:v:25:y:2009:i:5:p:527-531)
  by Ron S. Kenett
• Modern analysis of customer satisfaction surveys: comparison of models and integrated analysis (RePEc:wly:apsmbi:v:27:y:2011:i:5:p:465-475)
  by Ron S. Kenett & Silvia Salini
• Rejoinder to ‘Modern analysis of customer satisfaction surveys: comparison of models and integrated analysis’ (RePEc:wly:apsmbi:v:27:y:2011:i:5:p:484-486)
  by Ron S. Kenett & Silvia Salini
• ‘The COM‐Poisson model for count data: a survey of methods and applications’ by K. Sellers, S. Borle and G. Shmueli (RePEc:wly:apsmbi:v:28:y:2012:i:2:p:117-121)
  by Ron S. Kenett
• Industrial statistics applications in the semiconductor industry: some examples (RePEc:wly:apsmbi:v:29:y:2013:i:4:p:319-333)
  by Ron S. Kenett & Shelemyahu Zacks
• A special issue on: Actual impact and future perspectives on stochastic modelling in business and industry (RePEc:wly:apsmbi:v:31:y:2015:i:1:p:1-2)
  by Ron S. Kenett & Galit Shmueli
• A review of data science in business and industry and a future view by G. Vicario and S. Coleman (RePEc:wly:apsmbi:v:36:y:2020:i:1:p:30-32)
  by Ron S. Kenett